✦ LIBER ✦
Investigation of Low-Frequency Noise Behavior After Hot-Carrier Stress in an n-Channel Junctionless Nanowire MOSFET
✍ Scribed by Park, Chan-Hoon; Ko, Myung-Dong; Kim, Ki-Hyun; Lee, Sang-Hyun; Yoon, Jun-Sik; Lee, Jeong-Soo; Jeong, Yoon-Ha
- Book ID
- 127138061
- Publisher
- IEEE
- Year
- 2012
- Tongue
- English
- Weight
- 869 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0741-3106
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