In depth static and low-frequency noise characterization of n-channel FinFETs on SOI substrates at cryogenic temperature

✍ Scribed by Achour, H.; Cretu, B.; Routoure, J.-M.; Carin, R.; Talmat, R.; Benfdila, A.; Simoen, E.; Claeys, C.

• Book ID: 122327958
• Publisher: Elsevier Science
• Year: 2014
• Tongue: English
• Weight: 729 KB
• Volume: 98
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/j.sse.2014.04.001