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Low-Frequency-Noise Investigation of n-Channel Bulk FinFETs Developed for One-Transistor Memory Cells

✍ Scribed by Simoen, E.; de Andrade, M.G.C.; Aoulaiche, M.; Collaert, N.; Claeys, C.


Book ID
114620915
Publisher
IEEE
Year
2012
Tongue
English
Weight
763 KB
Volume
59
Category
Article
ISSN
0018-9383

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