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Investigation into the nature of historical tapestries using time of flight secondary ion mass spectrometry (ToF-SIMS)

✍ Scribed by J. Batcheller; A.M. Hacke; R. Mitchell; C.M. Carr

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 117 KB
Volume: 252
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2006.02.136

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