✦ LIBER ✦

X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis of UV-exposed polystyrene

✍ Scribed by Richard M. France; Liam O'Toole; Robert D. Short; Nino Pollicino

Publisher: John Wiley and Sons
Year: 1995
Tongue: English
Weight: 609 KB
Volume: 196
Category: Article
ISSN: 1022-1352
DOI: 10.1002/macp.1995.021961122

No coin nor oath required. For personal study only.

✦ Synopsis

Abstract

The surface photochemistry of polystyrene is shown to exhibit features that distinguish it from the bulk and from the polymer in solution. We report on the use of medium‐ and high‐resolution time‐of‐flight secondary ion mass spectrometry and X‐ray photoelectron spectroscopy in an investigation of the changes that occur as a result of exposure to UV light from a ‘black lamp’ source. The experiment mimics closely the effects of natural sunlight. It is shown that there are substantial changes occurring in the surface molecular structure of polystyrene on irradiation, which correspond to loss of aromaticity, and that these changes precede any uptake of oxygen.

📜 SIMILAR VOLUMES

Surface functionalization of PEEK films

Surface functionalization of PEEK films studied by time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy

✍ Henneuse-Boxus, Catherine; Poleunis, Claude; De Ro, Astrid; Adriaensen, Yasmine; 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 279 KB 👁 2 views

Using the wet chemistry method, the surface of poly(aryl ether ether ketone) (PEEK) Ðlm was selectively modiÐed to produce PEEK-OH, PEEK-COOH, PEEK-glutamine, and samples displaying, PEEK-NH 2 PEEK-SO 3 H respectively, hydroxyl, carboxyl, amino acid, amine and sulphonyl functions. All the samples we

A time-of-flight secondary ion mass spec

A time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy investigation of the structure of plasma polymers prepared from the methacrylate series of monomers

✍ Alison J Ward; Robert D Short 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 523 KB

Time-of-flight secondary ion mass spectr

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis of the bleaching of keratin fibres and the application of cationic alkyl protein softeners to bleached cashmere

✍ S. Volooj; C. M. Carr; R. Mitchell; J. C. Vickerman 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 356 KB 👁 2 views

Studies using ToF-SIMS have demonstrated that the 18-methyleicosanoic acid (18-MEA) bound to the fibre, via a thioester linkage, is the major lipid present at keratin fibre surfaces. Relatively higher levels of eicosanoic acid were detected by ToF-SIMS than has been observed by wet chemical analysis