The changes in the mobility and carrier concentration in annealed modulation doping Si/Si 0.8 Ge 0.2 heterostructures with various channel thicknesses have been studied and mobility-limiting mechanisms were clarified. The dominant scattering mechanism was found to change to scattering due to uniform
Inverted modulation-doped n-type Si/Si0.77Ge0.23 heterostructures
โ Scribed by R.B. Dunford; A. Ahmed; D.J. Paul; M. Pepper; A.C. Churchill; D.J. Robbins; A.J. Pidduck
- Book ID
- 104305459
- Publisher
- Elsevier Science
- Year
- 2000
- Tongue
- English
- Weight
- 528 KB
- Volume
- 53
- Category
- Article
- ISSN
- 0167-9317
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โฆ Synopsis
Inverted n-type modulated-doped Si/Si0.77Ge0.23 heterostructures have been prepared using ex-situ ion implantation of a virtual substrate for the doping followed by cleaning and the regrowth of the silicon quantum well in the growth system. At 1.7K sample mobilities of 1.5-7.3xl04cm:/Vs and carrier densities of 4.25-14.5 lxl0 t~cm "2 were obtained. The sample mobility was observed to decrease with increasing ion dose (and carrier density). Clear Shubnikov-de Haas oscillations and quantum Hall effect plateaux were visible, demonstrating the quality of the technique.
๐ SIMILAR VOLUMES
The transport behaviors of two GaN/AlGaN two-dimensional electron systems (2DESs) grown on Si substrates were studied, and a SiN x treatment employed in sample fabrication enhanced the conductance of one of the 2DESs. We study the electron heating effect in the 2DESs experimentally, with resistances