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Fabrication of 0.12 μm pMOSFETs on high Ge fraction Si/Si1−xGex/Si(1 0 0) heterostructure with ultrashallow source/drain formed using B-doped SiGe CVD

✍ Scribed by Doohwan Lee; Shinobu Takehiro; Masao Sakuraba; Junichi Murota; Toshiaki Tsuchiya


Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
312 KB
Volume
224
Category
Article
ISSN
0169-4332

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