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Interplay of voltage and temperature acceleration of oxide breakdown for ultra-thin oxides

✍ Scribed by E Wu; J Suñé; W Lai; E Nowak; J McKenna; A Vayshenker; D Harmon

Book ID
108411184
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
215 KB
Volume
59
Category
Article
ISSN
0167-9317

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