✦ LIBER ✦

Interface transient layer of amorphous silicon based multilayers measured by in situ ellipsometry

✍ Scribed by Y. Hatanaka; M. Ohkuwa; T. Yamaguchi

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Properties of a-Si:H based interface tra

✍ Yoshinori Hatanaka; Kunihiko Mitsuoka; Tomuo Yamaguchi 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 404 KB

In situ investigation of amorphous silic

✍ B. Drevillon 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 405 KB

Study of DLC/silicon interfaces by XPS a

✍ N. Fourches; G. Turban; B. Grolleau 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 878 KB

In situ investigation by IR ellipsometry

✍ R. Ossikovski; H. Shirai; B. Drévillon 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 373 KB

Investigation of the silicon-plasma sili

✍ J.R. Elmiger; M. Kunst 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 716 KB

Oxidation of silicon in r.f. plasma meas

✍ H. Shinno; M. Kitajima 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 306 KB