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Properties of a-Si:H based interface transient layers measured by in-situ ellipsometry

✍ Scribed by Yoshinori Hatanaka; Kunihiko Mitsuoka; Tomuo Yamaguchi

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 404 KB
Volume: 41-42
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(89)90128-1

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