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Interdiffusion of an Au/Ni/Cr multilayer metallization on silicon substrates

✍ Scribed by Benda Yan; Tongliang Lin; Dali Mao; Chensen Yang

Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
537 KB
Volume
173
Category
Article
ISSN
0040-6090

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**Thin films of organic metals** generally exhibit activated conductivity caused by intergrain conduction barriers. One of the few examples of thin films showing truly metallic character is TTF[Ni(dmit)~2~]~2~. Films electrodeposited on silicon substrates remain metallic down to 12 K in spite of the