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Depth resolution of multilayer Cr/Ni thin film structures deposited on substrates with different roughness

✍ Scribed by A. Zalar; S. Hofmann

Publisher: Elsevier Science
Year: 1987
Tongue: English
Weight: 790 KB
Volume: 37
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(87)90110-2

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