✦ LIBER ✦

Multiple-point depth profiling of multilayer Cr/Ni thin film structures on a rough substrate using scanning auger microscopy

✍ Scribed by A. Zalar; S. Hofmann; A. Žabkar

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

On the evaluation of depth resolution fr

✍ D. Marton; J. László 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 135 KB

Reply to “on the evaluation of depth res

✍ S. Hofmann 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 152 KB

Depth resolution of multilayer Cr/Ni thi

✍ A. Zalar; S. Hofmann 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 790 KB