Reply to “on the evaluation of depth resolution from depth profiles of multilayers: comment ‘multiple point depth profiling of multilayer Cr/Ni thin film structures deposited on a rough substrate using scanning Auger microscopy’”

✍ Scribed by S. Hofmann

• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 152 KB
• Volume: 136
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(86)90120-3