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[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - Defect-oriented IC test and diagnosis using VHDL fault simulation

✍ Scribed by Celeiro, F.; Dias, L.; Ferreira, J.; Santos, M.B.; Teixeira, J.P.

Book ID: 120883701
Publisher: Int. Test Conference
Year: 1996
Tongue: English
Weight: 926 KB
Category: Article
ISBN-13: 9780780335417
DOI: 10.1109/TEST.1996.557119

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