[Int. Test Conference International Test Conference 1998 - Washington, DC, USA (18-23 Oct. 1998)] Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) - Test vector decompression via cyclical scan chains and its application to testing core-based designs

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✍ Aerts, J.; Marinissen, E.J. 📂 Article 📅 1998 🏛 Int. Test Conference ⚖ 980 KB

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✍ Schrift, R. 📂 Article 📅 1998 🏛 Int. Test Conference ⚖ 474 KB

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✍ Stroud, C.; Wijesuriya, S.; Hamilton, C.; Abramovici, M. 📂 Article 📅 1998 🏛 Int. Test Conference ⚖ 767 KB

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✍ Varma, P.; Bhatia, B. 📂 Article 📅 1998 🏛 Int. Test Conference ⚖ 794 KB

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✍ Ilyoung Kim, ; Zorian, Y.; Komoriya, G.; Pham, H.; Higgins, F.P.; Lewandowski, J 📂 Article 📅 1998 🏛 Int. Test Conference ⚖ 622 KB

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✍ Voyiatzis, I.; Paschalis, A.; Nikolos, D.; Halatsis, C. 📂 Article 📅 1998 🏛 Int. Test Conference ⚖ 773 KB