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[Int. Test Conference International Test Conference 1998 - Washington, DC, USA (18-23 Oct. 1998)] Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) - Built in self repair for embedded high density SRAM

✍ Scribed by Ilyoung Kim, ; Zorian, Y.; Komoriya, G.; Pham, H.; Higgins, F.P.; Lewandowski, J.L.

Book ID: 120594311
Publisher: Int. Test Conference
Year: 1998
Weight: 622 KB
Category: Article
ISBN-13: 9780780350939
DOI: 10.1109/TEST.1998.743312

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