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[Int. Test Conference International Test Conference 1998 - Washington, DC, USA (18-23 Oct. 1998)] Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) - A tree-structured LFSR synthesis scheme for pseudo-exhaustive testing of VLSI circuits

โœ Scribed by Jone, W.B.; Rau, J.C.; Chang, S.C.; Wu, Y.L.


Book ID
118252600
Publisher
Int. Test Conference
Year
1998
Weight
898 KB
Volume
0
Category
Article
ISBN-13
9780780350939

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