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[Int. Test Conference International Test Conference 1998 - Washington, DC, USA (18-23 Oct. 1998)] Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) - Scan chain design for test time reduction in core-based ICs

✍ Scribed by Aerts, J.; Marinissen, E.J.

Book ID: 126822789
Publisher: Int. Test Conference
Year: 1998
Weight: 980 KB
Category: Article
ISBN-13: 9780780350939
DOI: 10.1109/test.1998.743185

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