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[Int. Test Conference International Test Conference 1998 - Washington, DC, USA (18-23 Oct. 1998)] Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) - R-CBIST: an effective RAM-based input vector monitoring concurrent BIST technique

✍ Scribed by Voyiatzis, I.; Paschalis, A.; Nikolos, D.; Halatsis, C.

Book ID: 125931575
Publisher: Int. Test Conference
Year: 1998
Weight: 773 KB
Category: Article
ISBN-13: 9780780350939
DOI: 10.1109/TEST.1998.743284

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