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[Int. Test Conference International Test Conference 1997 - Washington, DC, USA (1-6 Nov. 1997)] Proceedings International Test Conference 1997 - Hierarchical specification-driven analog fault modeling for efficient fault simulation and diagnosis

✍ Scribed by Voorakaranam, R.; Chakrabarti, S.; Hou, J.; Gomes, A.; Cherubal, S.; Chatterjee, A.; Kao, W.

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