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[Int. Test Conference International Test Conference 1997 - Washington, DC, USA (1-6 Nov. 1997)] Proceedings International Test Conference 1997 - Intrinsic leakage in low power deep submicron CMOS ICs

✍ Scribed by Keshavarzi, A.; Roy, K.; Hawkins, C.F.

No coin nor oath required. For personal study only.

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