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[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - Developing a Testing Maturity Model for software test process evaluation and improvement

✍ Scribed by Burnstein, I.; Suwanassart, T.; Carlson, R.

Book ID: 125454393
Publisher: Int. Test Conference
Year: 1996
Tongue: English
Weight: 995 KB
Category: Article
ISBN-13: 9780780335417
DOI: 10.1109/test.1996.557106

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