[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - BIST fault diagnosis in scan-based VLSI environments

✍ Scribed by Yuejian Wu, ; Adham, S.

• Book ID: 118028301
• Publisher: Int. Test Conference
• Year: 1996
• Tongue: English
• Weight: 1016 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780335417
• DOI: 10.1109/test.1996.556944