๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - BIST fault diagnosis in scan-based VLSI environments

โœ Scribed by Yuejian Wu, ; Adham, S.


Book ID
118028301
Publisher
Int. Test Conference
Year
1996
Tongue
English
Weight
1016 KB
Volume
0
Category
Article
ISBN-13
9780780335417

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