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Infrared spectroscopy of oxygen interstitials and precipitates in nitrogen-doped silicon

✍ Scribed by R. Štoudek; J. Humlíček

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 162 KB
Volume: 376-377
Category: Article
ISSN: 0921-4526
DOI: 10.1016/j.physb.2005.12.040

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