✦ LIBER ✦

Infrared spectroscopy of oxide layers on technical Si wafers

✍ Scribed by P. Grosse; B. Harbecke; B. Heinz; R. Meyer; M. Offenberg

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Ellipsometric analysis of ultrathin oxid

✍ T Motooka; Y Kusano; K Nisihira; N Kato 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 180 KB

On the impact of nanotopography of silic

✍ R Schmolke; R Deters; P Thieme; R Pech; H Schwenk; G Diakourakis 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 532 KB

Influence of the silicon wafer cleaning

✍ B. Garrido; J. Samitier; J.R. Morante; L. Fonseca; F. Campabadal 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 296 KB

X-ray photoelectron spectroscopy study o

✍ T.J. Šarapatka 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 541 KB

Infrared Spectroscopy of LiF on Ag and S

✍ J. Humlíček 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 189 KB

FT-IR-ATR observation of SiOH and SiH in

✍ Nagasawa, Yoshikatsu ;Ishida, Hideyuki ;Soeda, Fusami ;Ishitani, Akira ;Yoshii, 📂 Article 📅 1988 🏛 Springer-Verlag ⚖ 164 KB