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Ellipsometric analysis of ultrathin oxide layers on SIMOX wafers

✍ Scribed by T Motooka; Y Kusano; K Nisihira; N Kato

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Analysis of ultrathin oxide growth on in

✍ J.M. Eldridge; Y.J. Van der Meulen; D.W. Dong 📂 Article 📅 1972 🏛 Elsevier Science 🌐 English ⚖ 194 KB

On the impact of nanotopography of silic

✍ R Schmolke; R Deters; P Thieme; R Pech; H Schwenk; G Diakourakis 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 532 KB

Local characterization of ultrathin oxid

✍ A.L. Vasquez de Parga; C. Ocal; J.E. Ortega; R. Miranda 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 423 KB

Oxidation of ultrathin iron layers grown

✍ C. Ruby; J. Fusy 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 679 KB

Optimizing the ellipsometric analysis of

✍ Harland G. Tompkins; Steven Smith; Diana Convey 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 118 KB

Oxidation of ultrathin iron layers on Cu

✍ H. den Daas; O.L.J. Gijzeman; J.W. Geus 📂 Article 📅 1993 🏛 Elsevier Science ⚖ 67 KB