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Local characterization of ultrathin oxides on silicon wafers by scanning tunneling microscopy

✍ Scribed by A.L. Vasquez de Parga; C. Ocal; J.E. Ortega; R. Miranda

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 423 KB
Volume: 41
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(90)93783-f

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