Local characterization of ultrathin oxides on silicon wafers by scanning tunneling microscopy : A. L. Vazquez de Parga, C. Ocal, J. E. Ortega and R. Miranda. Vacuum 41(4), 784 (1990)

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 127 KB
• Volume: 31
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(91)90455-g