Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons

✍ Scribed by Mathias Schubert (auth.)

Publisher: Springer-Verlag Berlin Heidelberg
Year: 2005
Tongue: English
Leaves: 181
Series: Springer Tracts in Modern Physics 209
Edition: 1
Category: Library

No coin nor oath required. For personal study only.

✦ Synopsis

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects.

A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.

✦ Table of Contents

Introduction....Pages 1-6
Ellipsometry....Pages 7-29
Infrared Model Dielectric Functions....Pages 31-43
Polaritons in Semiconductor Layer Structures....Pages 45-65
Anisotropic Substrates....Pages 67-79
Zincblende-Structure Materials (III–V)....Pages 81-107
Wurtzite-Structure Materials (Group-III Nitrides, ZnO)....Pages 109-145
Magneto-Optic Ellipsometry....Pages 147-164
4×4 Transfer Matrix T p for Isotropic Films....Pages 165-167
4 × 4 Transfer Matrix T p for Dielectric Homogeneous Films....Pages 169-170
4 × 4 Transfer Matrix T p for Magneto-optic Films....Pages 171-172
4 × 4 Transfer Matrix T p for Dielectric Helical Films....Pages 173-179
TM Waves at the Interface Between Two Half-Infinite Media....Pages 181-183
TM Waves at Two Stratified Interfaces....Pages 185-190

✦ Subjects

Surfaces and Interfaces, Thin Films; Optical and Electronic Materials; Applied Optics, Optoelectronics, Optical Devices; Physics and Applied Physics in Engineering

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