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Influences of structure around gate-edge on high electric field strength in MISFETs with high-k gate dielectrics

✍ Scribed by Ono, M.; Nishiyama, A.

Book ID: 114617291
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 237 KB
Volume: 51
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2003.820684

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