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Suppression of Dynamic On-Resistance Increase and Gate Charge Measurements in High-Voltage GaN-HEMTs With Optimized Field-Plate Structure
✍ Scribed by Saito, W.; Nitta, T.; Kakiuchi, Y.; Saito, Y.; Tsuda, K.; Omura, I.; Yamaguchi, M.
- Book ID
- 114618830
- Publisher
- IEEE
- Year
- 2007
- Tongue
- English
- Weight
- 320 KB
- Volume
- 54
- Category
- Article
- ISSN
- 0018-9383
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