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Influence of surface topography on depth profiles obtained by Rutherford backscattering spectrometry

✍ Scribed by Slotte, J.; Laakso, A.; Ahlgren, T.; Rauhala, E.; Salonen, R.; RaÌisaÌnen, J.; Simon, A.; Uzonyi, I.; Kiss, AÌ. Z.; Somorjai, E.

Book ID: 121512864
Publisher: American Institute of Physics
Year: 2000
Tongue: English
Weight: 517 KB
Volume: 87
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.371835

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