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Influence of substrate bombardment on sputtered a-Si:N thin film properties

โœ Scribed by A. Attaf; M.L. Benkhedir; M.S. Aida


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
274 KB
Volume
355
Category
Article
ISSN
0921-4526

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TiO 2 thin films were deposited on unheated and heated glass substrates at an elevated sputtering pressure of 3 Pa by radio frequency (RF) reactive magnetron sputtering. TiO 2 films deposited at room temperature were annealed in air for 1 h at various temperatures ranging from 300 to 600 ยฐC. The str