Influence of sputtering power on the structural and morphological properties of semiconducting Mg2Si films
β Scribed by Qingquan Xiao; Quan Xie; Zhiqiang Yu; Kejie Zhao
- Publisher
- Elsevier
- Year
- 2011
- Tongue
- English
- Weight
- 620 KB
- Volume
- 11
- Category
- Article
- ISSN
- 1875-3892
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
## Abstract Nanostructured ZnO thin films were coated on glass substrate by spray pyrolysis using Zinc acetate dihydrate as precursor. Effect of precursor concentration on structural, morphological, optical and electrical properties of the films was investigated. The crystal structure and orientati
The effects of discharge radiofrequency (RF) power and film thickness were studied on the characteristics of Ca5(P0,),0H (hydroxyapatite) thin films fabricated by RF magnetron sputtering. The structure and chemical composition were investigated with a-step (thickness), scanning electron microscopy (