Thickness-dependent structural and optic
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Sha Zhao; Fei Ma; Zhongxiao Song; Kewei Xu
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Article
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2008
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Elsevier Science
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English
โ 255 KB
ZrO 2 thin films in thickness of 17 nm to 559 nm were deposited on Si-(1 0 0) and glass substrates using mid-frequency reactive magnetron sputtering method. The microstructure analysis showed that the stable monoclinic phase preferentially grew in the initial growth stage, whereas the relative amoun