𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Influence of slurry components on uniformity in copper chemical mechanical planarization

✍ Scribed by Hyunseop Lee; Boumyoung Park; Haedo Jeong


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
841 KB
Volume
85
Category
Article
ISSN
0167-9317

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Pad Surface Roughness and Slurry Particl
✍ C. Wang; P. Sherman; A. Chandra; D. Dornfeld πŸ“‚ Article πŸ“… 2005 πŸ› International Academy for Production Engineering 🌐 English βš– 677 KB

The ability to predict material removal rates in chemical mechanical planarization (CMP) is an essential ingredient for low cost, high quality IC chips. Recently, models that address the slurry particles have been proposed. We address three such models. The first two differ only in how the number of