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Influence of layer structure on performance of AlGaN/GaN high electron mobility transistors before and after passivation

✍ Scribed by J. Bernát; P. Javorka; A. Fox; M. Marso; P. Kordoš


Book ID
107453242
Publisher
Springer US
Year
2004
Tongue
English
Weight
82 KB
Volume
33
Category
Article
ISSN
0361-5235

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## Abstract We investigated low‐frequency noise in passivated and nonpassivated AlGaN/GaN high electron mobility transistor (HEMT) heterostructures grown on SiC substrate. The heterostructure layers are grown without intentionally doping the barrier material and two‐dimensional gas appears at the i