Influence of Lateral Charge Inhomogeneities in MOS Structures on the Determination of the Interface State Density Distribution from HF CV Curves

✍ Scribed by Fenske, F.

• Publisher: John Wiley and Sons
• Year: 1983
• Tongue: English
• Weight: 371 KB
• Volume: 79
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210790212