✦ LIBER ✦

The Effect of Errors in Semiconductor Constants on the Interface State Density Determination in MOS Structures

✍ Scribed by Aleksandrova, S. P. ;Kirov, K. I.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Effect of oxide resistance on the charac

✍ Jing-Jenn Lin; Jenn-Gwo Hwu 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 451 KB

Influence of a postoxidation cooling on

✍ S. Kaschieva 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 195 KB

Influence of Lateral Charge Inhomogeneit

✍ Fenske, F. 📂 Article 📅 1983 🏛 John Wiley and Sons 🌐 English ⚖ 371 KB

Interface state density measurement in M

✍ A. de Dios; E. Castán; L. Bailón; J. Barbolla; M. Lozano; E. Lora-Tamayo 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 576 KB

Simple Method for Determination of the I

✍ Jakubowski, A. ;Iniewski, K. 📂 Article 📅 1982 🏛 John Wiley and Sons 🌐 English ⚖ 234 KB

The effect of errors in rate constants o

✍ M.H. Bortner 📂 Article 📅 1961 🏛 Elsevier Science 🌐 English ⚖ 346 KB