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Simple Method for Determination of the Interface Trap Density at the Midgap in MOS Structures

✍ Scribed by Jakubowski, A. ;Iniewski, K.

Publisher: John Wiley and Sons
Year: 1982
Tongue: English
Weight: 234 KB
Volume: 73
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210730230

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