Simple method for the determination of the interface trap density at 77 K in fully depleted accumulation mode SOI MOSFETs

✍ Scribed by J.A. Martino; E. Simoen; U. Magnusson; A.L.P. Rotondaro; C. Claeys

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 518 KB
• Volume: 36
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(93)90004-a