A new method for determining the front and back interface trap densities of accumulation mode SOI MOSFETs at 77K

✍ Scribed by J.A Martino; E Simoen; C Claeys

• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 478 KB
• Volume: 38
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(94)00284-m