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Influence of interface states on field effect and capacitance-voltage characteristics of metal/oxide/a-Si:H structures

✍ Scribed by Tohru Suzuki; Masataka Hirose; Masato Ueda; Yukio Osaka

Publisher: Elsevier Science
Year: 1982
Weight: 326 KB
Volume: 8
Category: Article
ISSN: 0165-1633
DOI: 10.1016/0165-1633(82)90071-5

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