Bulk and interface Gap states in a-Si:H: A comparative study of field effect and capacitance measurements on codeposited samples

✍ Scribed by A. Lachter; R.L. Weisfield; William Paul

• Publisher: Elsevier Science
• Year: 1982
• Weight: 794 KB
• Volume: 7
• Category: Article
• ISSN: 0165-1633
• DOI: 10.1016/0165-1633(82)90001-6