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In-situ SEM study of cavity growth during high temperature oxidation of β-(Ni,Pd)Al

✍ Scribed by D Oquab; D Monceau

Book ID
114386609
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
685 KB
Volume
44
Category
Article
ISSN
1359-6462

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A high temperature X-ray diffraction method based on the Laue (transmission) mode was developed to measure strains associated with the growth of an oxide scale on a metal. These growth strains in the attached oxide scale and metal substrate are determined simultaneously and in real time by the chang