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In-situ high temperature X-ray diffraction study of Ni/Al2O3 interface reactions

✍ Scribed by Toru Fujimura; Shun-Ichiro Tanaka

Book ID
108492126
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
425 KB
Volume
45
Category
Article
ISSN
1359-6454

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A high temperature X-ray diffraction method based on the Laue (transmission) mode was developed to measure strains associated with the growth of an oxide scale on a metal. These growth strains in the attached oxide scale and metal substrate are determined simultaneously and in real time by the chang