A high temperature X-ray diffraction method based on the Laue (transmission) mode was developed to measure strains associated with the growth of an oxide scale on a metal. These growth strains in the attached oxide scale and metal substrate are determined simultaneously and in real time by the chang
β¦ LIBER β¦
The determination of stresses during oxidation of Ni: in situ measurements by XRD at high temperature
β Scribed by A.M. Huntz; C. Liu; M. Kornmeier; J.L. Lebrun
- Book ID
- 115847665
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 497 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0010-938X
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