In-depth Auger analysis of aluminium-silicon interfacial reactions
โ Scribed by H.C. Card; K.E. Singer
- Publisher
- Elsevier Science
- Year
- 1975
- Tongue
- English
- Weight
- 195 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0040-6090
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๐ SIMILAR VOLUMES
In-depth composition profiles of the an&c oxide films grown on Al (1 I1 ), (I 10) and (100) single crystal electrodes in ammonium borate were studied by Auger electron spectroscopy with Ar ion etching. The oxide film had the composition of Ai,O, as referenced to an authentic a-Al,O, single crystal.
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