Improvement in the Bias Stability of Zinc-Tin Oxide Thin-Film Transistors by Hafnium Doping

✍ Scribed by Dong-Suk Han, Jae-Hyung Park, Yu-Jin Kang, Jong-Wan Park

• Book ID: 120925677
• Publisher: Springer US
• Year: 2013
• Tongue: English
• Weight: 765 KB
• Volume: 42
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-013-2618-8